NSI-MI compact antenna multi-test system

NSI-700S-360 Spherical Near Field antenna measurement system is a spherical scanner operating at frequencies up to 500 GHz. It consists of a dual-axis, “theta over phi”, positioning arrangement. Unique to this product is the capability to mount a test antenna on a stationary THz probe station while completing a full 4π steradian closed spherical surface measurement of on-chip antennas. This means that prototype antennas can be rapidly tested without the costly and lengthy process of packaging the antenna with connectors so that it can be rotated on a conventional antenna test range. In the above figure the stationary AUT mounting plate is shown in the foreground.

The system is housed in a purpose built anechoic chamber 4.4m long, 3.1m wide and 3.1m high.

The NSI-700S-360 is supported by EPSRC under the Strategic Equipment Grant TERRA (THz antEnna fabRication and measuRement fAcilities).

MM-wave Modular Quasi-Optical Test Bench

The first of these systems uses a powerful state-of-the art Vector Network Analyser (VNA – Keysight PNA-X shown in above figure) working with a Quasi-Optical (QO) circuit. The VNA is a sophisticated generator and receiver of ultra-phase-stable, coherent, finely-tunable electromagnetic radiation. It can generate as well as detect, the amplitude and phase of radiation having frequencies up to 500 GHz, with a capability to rise to 1 THz. The QO circuit is a train of special beam-shaping mirrors that treat the sub-mm wave power as if a beam of light. The QO configuration shown above offers a focusing system that concentrates sub-mm wave power into a reaction vessel producing very high power densities at energies chosen to excite specific chemical bonds.
The Modular Quasi-Optical Test Bench is a flexible test system, which can be easily reconfigured enabling multiple circuit setups. Varieties of configurations can be achieved using different quasi-optical elements, such as:

• Corrugated horns
• Grid polarisers
• Focusing reflectors
• Flat reflectors

The figures below show examples of QO bench configurations that can be realised for particular EM studies in the mm and sub-mm wavelength range.

The Quasi-Optical Test Bench has been designed to perform different measurements. Among them:

Dielectrometry from 50–325 GHz and, in association with the Rutherford Appleton Laboratory, extendable to 600 GHz
Diffracted Gaussian Beam Analysis (Spatial Spectrum Analysis)
Analysis of dichroic, filters and active FSS in mm-wave

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